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Publications

Ewald van Dyk

E. van Dyk and E. Barnard, “Naive Bayesian classifiers for multinomial features: a theoretical analysis”, In Proceedings of the 18th Annual Symposium of the Pattern Recognition Association of South Africa (PRASA), pp 87-91, Pietermaritzburg, South Africa, November 2007.

   
  Contact: Marelie Davel +27 12 841 2466 mdavel@csir.co.za
   
Copyright © Meraka Institute 2007
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