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Publications

Christiaan van der Walt

C.M. Van der Walt and E. Barnard, “Data characteristics that determine classifier performance”, SAIEE Africa Research Journal, Vol 98 (3), pp 87-93, September 2007.

C.M Van der Walt and E. Barnard, “Measures for the characterisation of pattern-recognition data sets”, In Proceedings of the 18th Annual Symposium of the Pattern Recognition Association of South Africa (PRASA), pp 75-78, Pietermaritzburg, South Africa, November 2007.

C van der Walt and E. Barnard. “Data characteristics that determine classifier performance”, In Proceedings of the 17th Annual Symposium of the Pattern Recognition Association of South Africa, pp. 166-171 Parys, November 2006.

   
  Contact: Marelie Davel +27 12 841 2466 mdavel@csir.co.za
   
Copyright © Meraka Institute 2007
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